CReM ( Continous Reflectance Monitor )


The Continous Reflectance Monitor, developed in collaboration with CNR-IIA, allows measuring the spectral ranges within visible and near-IR wavelength reflectance and the acquisition of NIR-GB images of the snow cover. The interaction between the light and the surface is controlled, in the visible and near infrared wavelengths, by the presence of impurities, by the size and shape of the grains and by the liquid water content. Exploring and investigating the relationship between the reflected light and the snow micro-physics, we can describe the extension of the snow cover, the beginning of the melt season and to study its surface microphysical properties.

Monitoring the snow surfaces is essential for climatic-environmental studies and can significantly help the characterization of environmental changes in time and space.

The Continous Reflectance Monitor has the following characteristics:
· Bi-hemispherical observation geometry with PTFE (Teflon) diffuser with Lambertian response.
· Silicon dome speaker cover.
· Two response channels in the SWIR with selected wavelengths to describe the optical behavior of the snow cover in the SWIR wavelength domain.
· Metal container with internal temperature stabilization system.
· Power input requiring 24V and 1,5A maximum POE type.
· RJ45 output for text file transfer with instrument output.
· Adjustable bracket anchoring system.

(italian)