The Continous Reflectance Monitor is a device aimed to characterize the optical properties of the surface. The instrument detects downwelling and upwelling radiative fluxes on two distinct channels, which can be configured in the visible and near infrared wavelength domain.

The system is also equipped with a camera useful for checking the state of the surface. At the moment the developed application is dedicated to monitoring snow cover, where these measurements offer a description of the microphysical characteristics of the snowpack.

The interpretation of the spectral behavior of the reflected radiation provides diagnostic elements linked to the size and shape of the snow grains, the presence of interstitial liquid water, and therefore to the metamorphism of the snow cover.

The Continous Reflectance Monitor has the following characteristics:
· Bi-hemispherical observation geometry with PTFE (Teflon) diffuser with Lambertian response.
· Silicon dome speaker cover.
· Two response channels in the SWIR with selected wavelengths to describe the optical behavior of the snow cover in the SWIR wavelength domain.
· Metal container with internal temperature stabilization system.
· Power input of 24Vdc and 1.5A maximum, passive POE type.
· RJ45 output for text file transfer with instrument output.
· Adjustable bracket anchoring system.